Supported Data Acquisition

• Agilent 34970A
• Fluke Hydra 2620A, 2625, 2635
• Fluke 2680
• Fluke NetDAQ 2640, 2645
• TMI Orion Type 2
• Eurotherm 6 series.
• Eurotherm 5 series.
• Eurotherm/Chessel 4 series.
• TecnoSoft  TempStick & HumiStick
• TQSolutions Logger
• Yokogawa MicroR1800
• Anville 800 Series
• Anville 500
• Anville 435
• Anville 425
• Anville 415
• Yokogawa DXP, DX Range
• Kaye KL/Portable/Digi
• GEKaye Validator 2000
• MODBUS
• MODBUS TCP
• Simulation logger tool for software validation and user Test Specification validation.

Calibration & Calibration Checking

• Select calibration file to store results.
• Select channel groups for calibration
• Allow a test to use sensors calibrated in different groups.
• User managed calibration stability and set point profile.
• Automatic calibration option with automated stability analysis procedure.
• Calibration progress monitor window with adjustable reference temperature for manual calibration.
• Abort option.
• Detailed comprehensive calibration reports stored & archived with management window.
• Automatic management of calibration files. Test records are automatically assigned all relevant calibration reports for sensors used.
• Out of specification channels highlighted and when used in a test automatically set to defective.
• Automatic management of calibration checking files. Test records are automatically assigned all relevant check reports for sensors used.

Test Specifications

Allow user to create unlimited Test Specification files.

• Allow new file to start with copy of existing one.
• General Settings tab allows selection of
• channel configuration file
• calibration file
• sterilization/disinfection temp.
• scan interval
• automatic stop options
• stage analysis (for HTM2010)
• continuous monitoring options
• selection of time format
• chart configuration
• data list configuration
• Calculations tab allows setup of calculations based on each row of data
• Max per scan
• Min per scan
• Average per scan
• Max-Min per scan
• Max – Average per scan
• Average – Min per scan
• Min Lethality per scan
• Saturation temperature
• Saturation pressure
• Lethality tab allows configuration of lethality calculations
• Base temperature & Z value
• Probe group.
• Start lethality on temperature or stage.
• End lethality on stage.
• Temperature/Pressure correlation limit with reset option.
• Option to use lethality config on time at temperature calculations.
• Probe selection allowing location entry.
• Setup of stages for manual entry during the test.
• Setup of parameter specific to logger selected (eg TMI-ORION)
• Test Specification file is copied to test record for access historically as Test Detail.
• Historic changes do not affect Test Specifications on Setup menu.
• Test records have Test Setup report of Test Specification parameters.
• Historic tests can be re-analysed after fully audited changes to historic test specification.
• Channels can be set or unset to or from defective state.
• Channels set as defective are not reported or included in any calculations

The Chart

• Chart is fully configurable.
• Setup margins for printout.
• Setup range for each unit.
• Setup number of grid lines.
• Setup trace thickness.
• Real time chart all functions operational.
• Displays stages and I-Calc actions.
• Shows two vertical axis ranges, one temperature, the other non temperature (any units).
• Chart can be dragged & resized.
• Chart displays trace ID at customizable interval.
• Mouse pointer on chart shows values & time value at location.
• Data line option shows values & time at sliding line.
• Easy stage entry option at data line position.
• Zoom into any area and the zoom in again.
• Chart printout includes trace ID table.

Historical Test Storage & Retrieval

• All tests are stored in separate machine folders.
• Each test has entry in Historic Test Index.
• Test Index refresh option scans specified folder and all sub-folders for stored tests and creates new list.
• Historic Test List can be configured to show any number of test data fields.
• List can be filtered and sorted on date and time.
• List can be configured for ‘tree view’ mode to group tests according to any field (eg hospital site).
• Next and previous buttons sequences through tests updating the chart window with next record.

Company Name & System ID & Options

• User name heading all reports.
• Configuration file ID tag for group users.
• Selectable date format.

Calibration  Files

• Allows multiple calibration files selected on user managed names.
• Option to switch off calibration.
• Select from names for calibration function.
• Contains last calibrated date, time, pass/fail etc details for each channel.

Test Equipment Database

Store all information on Test Equipment in database allowing selectable serial numbers.

• Test equipment information automatically copied to calibration reports.
• Fields can be used in SVR Custom Forms.

Real Time Display

• Real time display window shows all values as soon as received from logger.
• Includes time above temperature, lethality, correlation etc.
• Shows time elapsed, current stage, elapsed stage time.

The Stages Window

• Stages window allows editing of file containing all possible stages, test specification stage list, or test record stage list.
• Allows alteration of ‘interval’ setting for each stage.
• Allows stages to be added from list of all possible stages.
• Allows stages to be removed.
• Allows user to manually enter the times of stages.
• In real time mode allows the next stage in the test specification list to be manually added.

Supported Calibration Baths

• ISOTECH Range
• GEKaye HTR400
• ASL B Series Metal Block Calibrator
• Isotech Calisto 2140B
• GEKaye LTR/HTR
• HART Micro 6102, 7102, 7103
• HART 7380
• Jofra ATC
• Fluke 917X Series

Supported Temperature Reference Devices

• HART/FLUKE 1502A & Compatible
• ISOTECH TTI6
• Kaye Intelligent RTD
• Kaye HTR400/LTR140 Controller
• ASL F250 MkII Precision Thermometer
• Isotech Calisto INDICATOR
• Isotech Calisto Controller
• ASL B Series Calibrator Controller
• Anville Series 270 Digital Thermometer
• Cropico 3001
• HART Micro 6102, 7102, 7103 Controller
• HART 7380 Controller
• AMETEK DTI

Security & 21 CFRpart 11

• Login window with ID & password.
• Password timeout & Renew.
• Electronic Signatures on Reports.
• Security Data is encrypted.
• Complete Audit Trail detailing Change History.
• Complete Audit Archive & Retrieve Changes Option.
• Security Management Window.
• Operator Profile Management.
• Operator Timeout & Password length & timeout Controls.
• Data Files Tamper Proofing.

Test Specifications I-Calcs

User configurable Interval Calculations

• User managed list window.
• Allow I-Calc duplication.
• Allow I-Calc copy to another Test Specification.
• Select purpose of I-Calc
• Chart line
• Stage or message insert.
• Continuous limit monitoring.
• Calculation on Interval
• Select group of probes
• Calculations available
• Selectable groups
• Selectable Interval
• Selectable Limits
• Set IO on Limit
• Set Message on Limit
• Set Report colour on Limit
• Select where calculation appears
• Set insert stage event on Limit.
• Interval Duration.
• Time at Temperature.
• Max probe value.
• Min of Maxs.
• (Max - Min) Of Maxs.
• Min probe value.
• Max of Mins.
• (Max - Min) Of Mins
• Average probe value.
• Max Average.
• Min Average.
• Fluctuation.
• Max Fluctuation
• Max Deviation.
• Max lethality.
• Min lethality.
• Lethality Deviation.
• Allow entry of limit values.
• Target value
• Upper limit.
• Lower limit.
• Hysteresis
• Allow entry of actions
• Message to show on chart and/or data list.
• Insert message at offset from actual time I-Calc is triggered.
• Highlight on failure.
• Hide on chart or data list option.
• Digital IO ON/OFF.
• Display screen message.

The Data List

• Highly detailed and configurable Data Listing option.
• Displays stages and I-Calc actions & results.
• Summary option allows data to be printed at intervals configured for each stage.
• Data List can be dragged & resized.
• Landscape or portrait option.
• Prints data in configurable colors according to value.
• If too many channels for one line, data is formatted to fit paper.
• All calculations can be shown.
• Electronic signature option

Data Management & Archiving

• Data Management window
• Allows selection of multiple Tests, Calibration records, Calibration Check records, or user configuration files.
• For user configuration files user can further select the type of files.
• Report on space requirement.
• Allows selection of drive or network location for copy target.
• Stores an ID on the target.
• Reports space available on target.
• Allows selected files to be copied and or deleted.
• Archive window allows
• Target drive or network location selection.
• Automatic archiving option at end of test or calibration.
• Real time archiving as test is being logged.
• Start button for archive process.
• Shows progress of archive process.
• When archiving only changed or new files are transferred.

Machine Records Database

• User managed database of equipment or facilities tested with custom fields.
• Select machine for each test.
• Information automatically copied to test records.
• Fields can be used in SVR Custom Forms.
• Filter records.

Channel Configurations

• Allows multiple channel configurations selected on user managed names.
• Automatically configures most loggers.
• Select Input Type.
• Select Chart Colour.
• Select Units, Decimal Places.
• User managed channel names.

Running a Test

• Selection of Test Specification.
• Entry of Job reference.
• Entry of cycle number.
• Selection of machine or facility being tested.
• Custom entries are available.
• Most application functions available while test is logging.
• Or multiple TQS programs can be run from same folder, one logging a test, the other being used to create reports.

The Test Merge Feature

• Data from different kinds of logger can be merged into a new test record.
• Specify how time differences are handled.
• Specify a Test Specification to use for the new merged test record.
• Select data from any number of tests and select specific channels to merge.
• Auto selection feature on matching sensor locations.